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High resolution scanning transmission electron microscopy (HR STEM) analysis of tungsten-doped amorphous carbon films

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Rasinski,  M.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Adelhelm,  C.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Balden,  M.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Rasinski, M., Plocinski, T., Adelhelm, C., Balden, M., Ciupinski, L., & Kurzydlowski, K. J. (2010). High resolution scanning transmission electron microscopy (HR STEM) analysis of tungsten-doped amorphous carbon films. Poster presented at European Energy Conference, Barcelona.


Cite as: https://hdl.handle.net/21.11116/0000-0000-506B-E
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