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Charakterisierung mittels Rasterelektronenmikroskopie (SEM) und fokusiertem Ionenstahl (FIB)

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Balden,  M.       
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Balden, M. (2009). Charakterisierung mittels Rasterelektronenmikroskopie (SEM) und fokusiertem Ionenstahl (FIB). Vorlesung Oberflächentechnik (SS 2009). Technische Universität München.


Cite as: https://hdl.handle.net/21.11116/0000-0000-5178-E
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