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Ion beam analysis of porous thin films

MPS-Authors
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Mayer,  M.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110652

von Toussaint,  U.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Mayer, M., von Toussaint, U., Dewalque, J., Dubreuil, O., Henrist, C., Cloots, R., et al. (2011). Ion beam analysis of porous thin films. Poster presented at 20th International Conference on Ion Beam Analysis (IBA 2011), Itapema, SC.


Cite as: https://hdl.handle.net/21.11116/0000-0000-5B2E-8
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