Bayesian derivation of electron temperature profile using JET ECE diagnostics

Schmuck, S.; Svensson, J.; de la Luna, E.; Figini, L.; Johnson, T.; Alper, B.; Beurskens, M.; Fessey, J.; Gerbaud, T.; Sirinelli, A.; JET EFDA Contributors

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Bayesian derivation of electron temperature profile using JET ECE diagnostics

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Schmuck, S.
W7-X: Physics (PH), Max Planck Institute for Plasma Physics, Max Planck Society;

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Svensson, J.
W7-X: Heating and CoDaC (HC), Max Planck Institute for Plasma Physics, Max Planck Society;
W7-X: Physics (PH), Max Planck Institute for Plasma Physics, Max Planck Society;

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Schmuck, S., Svensson, J., de la Luna, E., Figini, L., Johnson, T., Alper, B., Beurskens, M., Fessey, J., Gerbaud, T., Sirinelli, A., & JET EFDA Contributors (2011). Bayesian derivation of electron temperature profile using JET ECE diagnostics. Poster presented at 38th EPS Conference on Plasma Physics, Strasbourg.

引用: https://hdl.handle.net/21.11116/0000-0000-5E27-C

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