Information depth of low-energy ion scattering in the reionization regime

Primetzhofer, D.; Spitz, M.; Bauer, P.; Taglauer, E.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Poster

Information depth of low-energy ion scattering in the reionization regime

MPS-Authors

/persons/resource/persons110618

Taglauer, E.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Primetzhofer, D., Spitz, M., Bauer, P., & Taglauer, E. (2012). Information depth of low-energy ion scattering in the reionization regime. Poster presented at 25th Symposium on Surface Science 2012 (3S'12), St. Christoph/Arlberg.

Cite as: https://hdl.handle.net/21.11116/0000-0000-87EA-0

Abstract

There is no abstract available