Attosecond streaking metrology with isolated nanotargets

Liu, Qingcao; Seiffert, L.; Trabattoni, A.; Castrovilli, C.; Galli, M.; Rupp, Philipp; Frassetto, F.; Poletto, L.; Nisoli, M.; Rühl, E.; Krausz, Ferenc; Fennel, T.; Zherebtsov, Sergey; Calegari, F.; Kling, Matthias F.

doi:10.1088/2040-8986/aa9b08

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Attosecond streaking metrology with isolated nanotargets

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Liu, Qingcao
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Rupp, Philipp
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Krausz, Ferenc
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Zherebtsov, Sergey
Attosecond Imaging, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Kling, Matthias F.
Attosecond Imaging, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Liu, Q., Seiffert, L., Trabattoni, A., Castrovilli, C., Galli, M., Rupp, P., et al. (2018). Attosecond streaking metrology with isolated nanotargets. Journal of Optics, 20(2): 024002. doi:10.1088/2040-8986/aa9b08.

Cite as: https://hdl.handle.net/21.11116/0000-0000-B819-5

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