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Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction

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Krewer,  Keno L.
Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society;

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Mics,  Zoltan
Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society;

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Bonn,  Mischa
Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society;

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Turchinovich,  Dmitry
Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society;

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Krewer, K. L., Mics, Z., Arabski, J., Schmerber, G., Beaurepaire, E., Bonn, M., et al. (2018). Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction. Optics Letters, 43(3), 447-450. doi:10.1364/OL.43.000447.


Cite as: http://hdl.handle.net/21.11116/0000-0000-76F1-B
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