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Creep Behavior and Microstructural Changes During Short-Term Creep in a γ-TiAl Based Alloy with Fully Lamellar Microstructure

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Chatterjee,  Anita
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
GfE Metalle und Materialien GmbH, Hoefener Str. 45, D-90431 Nuremberg, Germany;

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Dehm,  Gerhard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt,  Eduard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Chatterjee, A., Clemens, H., Dehm, G., Mecking, H., Kestler, H., & Arzt, E. (2003). Creep Behavior and Microstructural Changes During Short-Term Creep in a γ-TiAl Based Alloy with Fully Lamellar Microstructure. In Gamma Titanium Aluminides 2003 (pp. 425-430).


Cite as: http://hdl.handle.net/21.11116/0000-0001-21B5-D
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