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Fast Method for Parametric System Identification of Gradient Systems

MPS-Authors
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Chang,  P
Department High-Field Magnetic Resonance, Max Planck Institute for Biological Cybernetics, Max Planck Society;

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Eschelbach,  M
Department High-Field Magnetic Resonance, Max Planck Institute for Biological Cybernetics, Max Planck Society;

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Avdievich,  N       
Research Group MR Spectroscopy and Ultra-High Field Methodology, Max Planck Institute for Biological Cybernetics, Max Planck Society;

/persons/resource/persons84187

Scheffler,  K       
Department High-Field Magnetic Resonance, Max Planck Institute for Biological Cybernetics, Max Planck Society;

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Henning,  A       
Research Group MR Spectroscopy and Ultra-High Field Methodology, Max Planck Institute for Biological Cybernetics, Max Planck Society;

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Citation

Chang, P., Eschelbach, M., Avdievich, N., Scheffler, K., & Henning, A. (2014). Fast Method for Parametric System Identification of Gradient Systems. Poster presented at Joint Annual Meeting ISMRM-ESMRMB 2014, Milano, Italy.


Cite as: https://hdl.handle.net/21.11116/0000-0001-32DF-C
Abstract
A method for characterising a gradient system is introduced. This is a parametric method and thus the system has an analytic form. It is fast and requires only one measurement in each gradient direction and can thus be completed in minutes. It can also be extended to characterise the shim system. Monitoring the B0 field is done using a 16 channel field camera. The predicted model is compared to measured data.