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Conference Paper

High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations

MPS-Authors
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Katnagallu,  Shyam
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Nematollahi,  Gholamali Ali
Adaptive Structural Materials (Simulation), Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Grabowski,  Blazej
Adaptive Structural Materials (Simulation), Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Neugebauer,  Jörg
Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Katnagallu, S., Nematollahi, G. A., Dagan, M., Moody, M. P., Grabowski, B., Gault, B., et al. (2017). High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations. In Proceedings of Microscopy & Microanaalysis 2017 (pp. 642-643). New York, NY, USA: Cambridge University Press. doi:10.1017/S1431927617003877.


Cite as: http://hdl.handle.net/21.11116/0000-0001-4963-E
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