Strong modification of thin film properties due to screening across the 
interface

Altendorf, S. G.; Reisner, A.; Tam, B.; Meneghin, F.; Wirth, S.; Tjeng, L. H.

doi:10.1103/PhysRevB.97.165422

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Strong modification of thin film properties due to screening across the interface

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Altendorf, S. G.
Simone Altendorf, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Reisner, A.
Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Tam, B.
Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Meneghin, F.
Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Wirth, S.
Steffen Wirth, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Tjeng, L. H.
Liu Hao Tjeng, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Altendorf, S. G., Reisner, A., Tam, B., Meneghin, F., Wirth, S., & Tjeng, L. H. (2018). Strong modification of thin film properties due to screening across the interface. Physical Review B, 97(16): 165422, pp. 1-5. doi:10.1103/PhysRevB.97.165422.

Cite as: https://hdl.handle.net/21.11116/0000-0001-3D28-F

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