Evaluation of EELS spectrum imaging data by spectral components and factors 
from multivariate analysis

Zhang, Siyuan; Scheu, Christina

doi:10.1093/jmicro/dfx091

アイテム詳細

登録内容を編集ファイル形式で保存

一時保存へ追加

タグ情報を表示リリース履歴を表示詳細要約

公開

学術論文

Evaluation of EELS spectrum imaging data by spectral components and factors from multivariate analysis

MPS-Authors

/persons/resource/persons138618

Zhang, Siyuan
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons76047

Scheu, Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Materials Analytics, RWTH Aachen University, Kopernikusstrasse 10, Aachen, Germany;

External Resource

There are no locators available

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

フルテキスト (公開)

公開されているフルテキストはありません

付随資料 (公開)

There is no public supplementary material available

引用

Zhang, S., & Scheu, C. (2018). Evaluation of EELS spectrum imaging data by spectral components and factors from multivariate analysis. Microscopy, 67(suppl_1), i133-i141. doi:10.1093/jmicro/dfx091.

引用: https://hdl.handle.net/21.11116/0000-0001-4978-7

要旨

要旨はありません