Dataset and Metrics for Predicting Local Visible Differences

Wolski, Krzysztof; Giunchi, Daniele; Ye, Nanyang; Didyk, Piotr; Myszkowski, Karol; Mantiuk, Rados\l{}aw; Seidel, Hans-Peter; Steed, Anthony; Mantiuk, Rafał K.

doi:10.1145/3196493

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Dataset and Metrics for Predicting Local Visible Differences

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Wolski, Krzysztof
Computer Graphics, MPI for Informatics, Max Planck Society;

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Didyk, Piotr
Computer Graphics, MPI for Informatics, Max Planck Society;

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Myszkowski, Karol
Computer Graphics, MPI for Informatics, Max Planck Society;

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Seidel, Hans-Peter
Computer Graphics, MPI for Informatics, Max Planck Society;

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Wolski, K., Giunchi, D., Ye, N., Didyk, P., Myszkowski, K., Mantiuk, R., et al. (2018). Dataset and Metrics for Predicting Local Visible Differences. ACM Transactions on Graphics, 37(5): 172. doi:10.1145/3196493.

Cite as: https://hdl.handle.net/21.11116/0000-0001-5F75-2

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