Dataset and Metrics for Predicting Local Visible Differences

Wolski, Krzysztof; Giunchi, Daniele; Ye, Nanyang; Didyk, Piotr; Myszkowski, Karol; Mantiuk, Rados\l{}aw; Seidel, Hans-Peter; Steed, Anthony; Mantiuk, Rafał K.

doi:10.1145/3196493

アイテム詳細

登録内容を編集ファイル形式で保存

一時保存へ追加

このアイテムの新しいバージョンが利用可能です:
https://pure.mpg.de/pubman/item/item_2593836_9

詳細要約

公開

学術論文

Dataset and Metrics for Predicting Local Visible Differences

MPS-Authors

/persons/resource/persons221198

Wolski, Krzysztof
Computer Graphics, MPI for Informatics, Max Planck Society;

/persons/resource/persons44312

Didyk, Piotr
Computer Graphics, MPI for Informatics, Max Planck Society;

/persons/resource/persons45095

Myszkowski, Karol
Computer Graphics, MPI for Informatics, Max Planck Society;

/persons/resource/persons45449

Seidel, Hans-Peter
Computer Graphics, MPI for Informatics, Max Planck Society;

External Resource

There are no locators available

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

フルテキスト (公開)

公開されているフルテキストはありません

付随資料 (公開)

There is no public supplementary material available

引用

Wolski, K., Giunchi, D., Ye, N., Didyk, P., Myszkowski, K., Mantiuk, R., Seidel, H.-P., Steed, A., & Mantiuk, R. K. (2018). Dataset and Metrics for Predicting Local Visible Differences. ACM Transactions on Graphics, 37(5):. doi:10.1145/3196493.

引用: https://hdl.handle.net/21.11116/0000-0001-5F75-2

要旨

要旨はありません