English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a twodimensional energy-dispersive detector

MPS-Authors
/persons/resource/persons125219

Kirchlechner,  Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Department of Materials Physics, Montanuniversität Leoben, Austria;

External Resource
No external resources are shared
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Abboud, A., Kirchlechner, C., Kečkéš, J., Çonka-Nurdan, T., Send, S., Micha, J.-S., et al. (2017). Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a twodimensional energy-dispersive detector. Journal of Applied Crystallography, 50(3), 901-908. doi:10.1107/S1600576717005581.


Cite as: http://hdl.handle.net/21.11116/0000-0001-6EE3-4
Abstract
There is no abstract available