FIB damage of Cu and possible consequences for miniaturized mechanical tests

Kiener, Daniel; Motz, Christian; Rester, Martin; Jenko, Monika; Dehm, Gerhard

doi:10.1016/j.msea.2007.01.046

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FIB damage of Cu and possible consequences for miniaturized mechanical tests

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Kiener, D., Motz, C., Rester, M., Jenko, M., & Dehm, G. (2007). FIB damage of Cu and possible consequences for miniaturized mechanical tests. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing, 459(1-2), 262-272. doi:10.1016/j.msea.2007.01.046.

Cite as: https://hdl.handle.net/21.11116/0000-0001-9824-B

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