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Scanning electron microscopy capabilities for sequential testing and analyses of full-size PFC components of AUG

MPS-Authors
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Balden,  M.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Elgeti,  S.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Neu,  R.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;
External Organizations;

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Greuner,  H.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Herrmann,  A.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;

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Krieger,  K.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Rohde,  V.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Zammuto,  I.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Balden, M., Elgeti, S., Neu, R., Greuner, H., Herrmann, A., Krieger, K., et al. (2018). Scanning electron microscopy capabilities for sequential testing and analyses of full-size PFC components of AUG. Poster presented at 23rd International Conference on Plasma Surface Interactions in Controlled Fusion Devices (PSI 23), Princeton, NJ.


Cite as: http://hdl.handle.net/21.11116/0000-0001-7003-D
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