Hole trap formation in polymer light-emitting diodes under current stress

Niu, Quan; Rohloff, Roland; Wetzelaer, Gert-Jan A. H.; Blom, Paul W. M.; Craciun, N. Irina

doi:10.1038/s41563-018-0057-x

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Hole trap formation in polymer light-emitting diodes under current stress

MPS-Authors

/persons/resource/persons199670

Niu, Quan
Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society;

/persons/resource/persons204650

Rohloff, Roland
Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society;

/persons/resource/persons146469

Wetzelaer, Gert-Jan A. H.
Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society;

/persons/resource/persons85143

Blom, Paul W. M.
Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society;

/persons/resource/persons128541

Craciun, N. Irina
Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Niu, Q., Rohloff, R., Wetzelaer, G.-J.-A.-H., Blom, P. W. M., & Craciun, N. I. (2018). Hole trap formation in polymer light-emitting diodes under current stress. Nature Materials, 17(6), 557-562. doi:10.1038/s41563-018-0057-x.

Cite as: https://hdl.handle.net/21.11116/0000-0001-736E-3

Abstract

There is no abstract available