Effects of thickness on the characteristic length scale of dislocation 
plasticity in Ag thin films

Kobrinsky, Mauro J.; Dehm, Gerhard; Thompson, Carl L.; Arzt, Eduard

doi:10.1016/S1359-6454(01)00225-7

アイテム詳細

登録内容を編集ファイル形式で保存

一時保存へ追加

タグ情報を表示リリース履歴を表示詳細要約

公開

学術論文

Effects of thickness on the characteristic length scale of dislocation plasticity in Ag thin films

MPS-Authors

/persons/resource/persons75388

Dehm, Gerhard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75228

Arzt, Eduard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource

There are no locators available

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

フルテキスト (公開)

公開されているフルテキストはありません

付随資料 (公開)

There is no public supplementary material available

引用

Kobrinsky, M. J., Dehm, G., Thompson, C. L., & Arzt, E. (2001). Effects of thickness on the characteristic length scale of dislocation plasticity in Ag thin films. Acta Materialia, 49(17), 3597-3607. doi:10.1016/S1359-6454(01)00225-7.

引用: https://hdl.handle.net/21.11116/0000-0001-9747-5

要旨

要旨はありません