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In-situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate

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Dehm,  Gerhard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt,  Eduard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm, G., & Arzt, E. (2000). In-situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate. Applied Physics Letters, 77(8), 1126-1128. doi:10.1063/1.1289488.


Cite as: http://hdl.handle.net/21.11116/0000-0001-966E-B
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