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Electron-energy-loss spectroscopy studies of Cu-α-Al2O3 interfaces grown by molecular beam epitaxy

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Scheu,  Christina
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Department of Materials Engineering, Technion - Israel Inst. of Technol., Haifa 32000, Israel;

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Dehm,  Gerhard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Department of Materials Engineering, Technion - Israel Inst. of Technol., Haifa 32000, Israel;

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Rühle,  Manfred
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Scheu, C., Dehm, G., Rühle, M., & Brydson, R. (1998). Electron-energy-loss spectroscopy studies of Cu-α-Al2O3 interfaces grown by molecular beam epitaxy. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, 78(2), 439-465. doi:10.1080/01418619808241913.


Cite as: http://hdl.handle.net/21.11116/0000-0001-9643-A
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