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Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces

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Dehm,  Gerhard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  Manfred
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm, G., Raj, R., & Rühle, M. (1996). Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces. Materials Science Forum, 207-209(2), 597-600. doi:10.4028/www.scientific.net/MSF.207-209.597.


Cite as: http://hdl.handle.net/21.11116/0000-0001-9560-A
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