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Electron Energy-Loss Spectroscopy at Cu/Al2O3 and Ti/Al2O3 Interfaces

MPS-Authors
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Scheu,  Christina
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm,  Gerhard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Müllejans,  Harald
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  Manfred
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Scheu, C., Dehm, G., Müllejans, H., & Rühle, M. (1996). Electron Energy-Loss Spectroscopy at Cu/Al2O3 and Ti/Al2O3 Interfaces. Materials Science Forum, 207-209(1), 181-184. doi:10.4028/www.scientific.net/MSF.207-209.181.


Cite as: https://hdl.handle.net/21.11116/0000-0001-9530-0
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