Growth and Structure of Copper Thin Films Deposited on (0001) Sapphire by 
Molecular Beam Epitaxy

Dehm, Gerhard; Rühle, Manfred; Ding, G.; Raj, Rishi

doi:10.1080/01418639508241899

アイテム詳細

登録内容を編集ファイル形式で保存

一時保存へ追加

タグ情報を表示リリース履歴を表示詳細要約

公開

学術論文

Growth and Structure of Copper Thin Films Deposited on (0001) Sapphire by Molecular Beam Epitaxy

MPS-Authors

/persons/resource/persons75388

Dehm, Gerhard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76016

Rühle, Manfred
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource

There are no locators available

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

フルテキスト (公開)

公開されているフルテキストはありません

付随資料 (公開)

There is no public supplementary material available

引用

Dehm, G., Rühle, M., Ding, G., & Raj, R. (1995). Growth and Structure of Copper Thin Films Deposited on (0001) Sapphire by Molecular Beam Epitaxy. Philosophical Magazine B-Physics of Condensed Matter Statistical Mechanics Electronic Optical and Magnetic Properties, 71(6), 1111-1124. doi:10.1080/01418639508241899.

引用: https://hdl.handle.net/21.11116/0000-0001-94E4-6

要旨

要旨はありません