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Oxygen K-edge X-ray absorption fine structure studies of vacuum-deposited ice films

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Grunze,  Michael
Cellular Biophysics, Max Planck Institute for Medical Research, Max Planck Society;

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Citation

Zubavichus, Y., Zharnikov, M., Yang, Y.-J., Fuchs, O., Umbach, E., Heske, C., et al. (2006). Oxygen K-edge X-ray absorption fine structure studies of vacuum-deposited ice films. Langmuir, 22(17), 7241-7247. doi:10.1021/la060379o.


Cite as: https://hdl.handle.net/21.11116/0000-0001-9EDC-6
Abstract
Multilayer ice films deposited on polycrystalline Au(111) substrates at 90 and 153 K under ultra-high-vacuum conditions are studied using O K-edge X-ray absorption fine structure spectroscopy in the surface-sensitive partial electron yield mode. Both near-edge and extended oscillatory fine structures are analyzed in combination with the theoretical real-space full-multiple-scattering simulations based on the FEFF8 code. The experimental data consistently indicate that the local structure of the near-surface regions in ice films at both substrate temperatures resembles that of high-density crystalline modifications of ice (e.g., ice II, ice III, or high-density amorphous ice). In addition, the ice films deposited at 153 K most probably contain a minor fraction of low-density cubic ice (Ic phase).