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Surface chemistry of H2S sensitive tungsten oxide films

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Grunze,  M.
Cellular Biophysics, Max Planck Institute for Medical Research, Max Planck Society;

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Citation

Frühberger, B., Grunze, M., & Dwyer, D. (1996). Surface chemistry of H2S sensitive tungsten oxide films. Sensors and Actuators b-Chemical, 31(3), 167-174. doi:10.1016/0925-4005(96)80062-1.


Cite as: https://hdl.handle.net/21.11116/0000-0001-AEEE-0
Abstract
We have applied X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS) to characterize thin tungsten oxide films and to investigate their interaction with hydrogen sulfide in view of their use as very sensitive hydrogen sulfide gas sensors. W 4f core-level spectra indicate a partial reduction of W6+ after the reaction. No evidence for band bending after H2S dosing could be found in the valence-band spectra. The results suggest that the primary sensing mechanism involves the formation of oxygen vacancies on the surface in the presence of hydrogen sulfide. Alternative mechanisms, such as the formation of a tungsten sulfide or a hydrogen tungsten bronze on the surface, are judged to be unlikely.