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Journal Article

Strain-Induced Asymmetric Line Segregation at Faceted Si Grain Boundaries

MPS-Authors
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Liebscher,  Christian
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stoffers,  Andreas
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Alam,  Masud
Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Lymperakis,  Liverios
Microstructure, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Neugebauer,  Jörg
Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Liebscher, C., Stoffers, A., Alam, M., Lymperakis, L., Cojocaru-Mirédin, O., Gault, B., et al. (2018). Strain-Induced Asymmetric Line Segregation at Faceted Si Grain Boundaries. Physical Review Letters, 121(015702): 015702, pp. 1 -5. doi:10.1103/PhysRevLett.121.015702.


Cite as: http://hdl.handle.net/21.11116/0000-0001-BCC9-9
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