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Increased detector efficiency helps to reveal new insights into compositional fluctuations at defects in Cu2ZnSnSe4 thin films

MPS-Authors
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Schwarz,  Torsten
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schwarz, T., Redinger, A., Siebentritt, S., Gault, B., Raabe, D., & Choi, P.-P. (2018). Increased detector efficiency helps to reveal new insights into compositional fluctuations at defects in Cu2ZnSnSe4 thin films. Poster presented at E-MRS Spring Meeting 2018, Strasbourg, France.


Cite as: https://hdl.handle.net/21.11116/0000-0001-D5E5-C
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