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In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire

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Hieke,  Stefan Werner
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Willinger,  Marc Georg
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Wang,  Zhu-Jun
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Richter,  Gunther
Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Hieke, S. W., Willinger, M. G., Wang, Z.-J., Richter, G., Dehm, G., & Scheu, C. (2017). In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. Talk presented at 13th Multinational Congress on Microscopy. Rovinj, Croatia. 2017-09-26 - 2017-09-29.


Cite as: https://hdl.handle.net/21.11116/0000-0002-0013-8
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