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Combining ultimate resolution: Cs corrected STEM and 3D atom probe tomography

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu, C. (2018). Combining ultimate resolution: Cs corrected STEM and 3D atom probe tomography. Talk presented at Grand Opening of UC Irvine Materials Research Institute (IMRI) & the First International Symposium on Advanced Microscopy and Spectroscopy, University of California. Irvine, CA, USA. 2018-06-06 - 2018-06-08.


Cite as: http://hdl.handle.net/21.11116/0000-0001-FFBE-B
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