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Direkte Beobachtung von Kristalldefekten in Massivproben mittels Electron-Channelling Contrast Imaging (ECCI) im REM

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S. (2016). Direkte Beobachtung von Kristalldefekten in Massivproben mittels Electron-Channelling Contrast Imaging (ECCI) im REM. Talk presented at Workshop "Von Nano bis Makro" der Europäischen Forschungsgesellschaft Dünne Schichten e.V. (EFDS). Dresden, Germany. 2016-11-07 - 2016-11-09.


Cite as: http://hdl.handle.net/21.11116/0000-0002-1807-C
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