English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Paper

Weak measurement of elliptical dipole moments by C point splitting

MPS-Authors
/persons/resource/persons225966

Nechayev,  Sergey
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201139

Neugebauer,  Martin
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201115

Leuchs,  Gerd
Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201008

Banzer,  Peter
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

Locator
There are no locators available
Supplementary Material (public)
There is no public supplementary material available
Citation

Nechayev, S., Neugebauer, M., Vorndran, M., Leuchs, G., & Banzer, P. (2018). Weak measurement of elliptical dipole moments by C point splitting. arXiv:1804.03890.


Cite as: http://hdl.handle.net/21.11116/0000-0002-1A57-0
Abstract
We investigate points of circular polarization in the far field of elliptically polarized dipoles and establish a relation between the angular position and helicity of these C points and the dipole moment. In the case of highly eccentric dipoles, the C points of opposite handedness exhibit only a small angular separation and occur in the low intensity region of the emission pattern. In this regard, we introduce an optical weak measurement approach that utilizes the transverse electric (azimuthal) and transverse magnetic (radial) far-eld polarization basis. Projecting the far field onto a spatially varying post-selected polarization state reveals the angular separation and the helicity of the C points. We demonstrate the applicability of this approach and determine the elliptical dipole moment of a particle sitting on an interface by measuring the C points in its far field.