Different Z DNA forming sequences are revealed in phi X174 RFI by high 
resolution darkfield immuno‐electron microscopy.

Revet, B.; Zarling, D. A.; Jovin, T. M.; Delain, E.

doi:10.1002/j.1460-2075.1984.tb02303.x

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Different Z DNA forming sequences are revealed in phi X174 RFI by high resolution darkfield immuno‐electron microscopy.

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Jovin, T. M.
Department of Molecular Biology, MPI for biophysical chemistry, Max Planck Society;

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Revet, B., Zarling, D. A., Jovin, T. M., & Delain, E. (1984). Different Z DNA forming sequences are revealed in phi X174 RFI by high resolution darkfield immuno‐electron microscopy. EMBO Journal, 3(13), 3353-3358. doi:10.1002/j.1460-2075.1984.tb02303.x.

Cite as: https://hdl.handle.net/21.11116/0000-0002-4BDB-4

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