Help Privacy Policy Disclaimer
  Advanced SearchBrowse




Journal Article

X-ray spectroscopy with variable line spacing based on reflection zone plate optics


Trinter,  Florian
Photon Science, Deutsches Elektronen-Synchrotron (DESY);
Institut für Kernphysik, Johann Wolfgang Goethe-Universität Frankfurt;
Molecular Physics, Fritz Haber Institute, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
Supplementary Material (public)
There is no public supplementary material available

Yin, Z., Löchel, H., Rehanek, J., Goy, C., Kalinin, A., Schottelius, A., et al. (2018). X-ray spectroscopy with variable line spacing based on reflection zone plate optics. Optics Letters, 43(18), 4390-4393. doi:10.1364/OL.43.004390.

Cite as: https://hdl.handle.net/21.11116/0000-0002-4EF2-6
X-ray spectroscopy is a method, ideally suited for investigating the electronic structure of matter, which has been enabled by the rapid developments in light sources and instruments. The X-ray fluorescence lines of life-relevant elements such as carbon, nitrogen, and oxygen are located in the soft X-ray regime and call for suitable spectrometer devices. In this work, we present a high resolution spectrum of liquid water, recorded with a soft X-ray spectrometer based on a reflection zone plate (RZP) design. The RZP-based spectrometer with meridional variation of line space density from 2953 l/mm to 3757 l/mm, offers extremely high detection efficiency and at the same time medium energy resolution. We can reproduce the well-known splitting of liquid water in the lone pair regime with 10 s acquisition time.