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Journal Article

Free-electron laser data for multiple-particle fluctuation scattering analysis

MPS-Authors
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Epp,  S. W.
Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Max Planck Advanced Study Group, Center for Free Electron Laser Science (CFEL);
Max-Planck-Institut für Kernphysik;

External Resource
Fulltext (public)

sdata2018201.pdf
(Publisher version), 680KB

Supplementary Material (public)

sdata2018201-isa1.zip
(Supplementary material), 4KB

Citation

Pande, K., Donatelli, J. J., Malmerberg, E., Foucar, L., Poon, B. K., Sutter, M., et al. (2018). Free-electron laser data for multiple-particle fluctuation scattering analysis. Scientific Data, 5: 180201. doi:10.1038/sdata.2018.201.


Cite as: http://hdl.handle.net/21.11116/0000-0002-55E4-D
Abstract
Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several orders of magnitude more information than traditional solution scattering data. Such experiments can be performed using the ultrashort X-ray pulses provided by a free-electron laser source, allowing one to collect a large number of diffraction patterns in a relatively short time. Here, we describe a test data set for FXS, obtained at the Linac Coherent Light Source, consisting of close to 100 000 multi-particle diffraction patterns originating from approximately 50 to 200 Paramecium Bursaria Chlorella virus particles per snapshot. In addition to the raw data, a selection of high-quality pre-processed diffraction patterns and a reference SAXS profile are provided.