Interface characterization of applied materials at ultimate resolution

Scheu, Christina

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Talk

Interface characterization of applied materials at ultimate resolution

MPS-Authors

/persons/resource/persons76047

Scheu, Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Scheu, C. (2018). Interface characterization of applied materials at ultimate resolution. Talk presented at Seminar at Beijing Institute of Technology. Beijing, China. 2018-09-24.

Cite as: https://hdl.handle.net/21.11116/0000-0002-860F-7

Abstract

There is no abstract available