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https://doi.org/10.1063/1.5038809 (Verlagsversion)
Kring_In_situ.pdf (beliebiger Volltext), 3MB
Kring, J., Pablant, N., Langenberg, A., Rice, J., Delgado-Aparicio, L., Maurer, D., et al. (2018). In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X. Review of Scientific Instruments, 89: 10F107. doi:10.1063/1.5038809.
