In situ wavelength calibration system for the X-ray Imaging Crystal 
Spectrometer (XICS) on W7-X

Kring, J.; Pablant, N.; Langenberg, A.; Rice, J.; Delgado-Aparicio, L.; Maurer, D.; Traverso, P.; Bitter, M.; Hill, K.; Reinke, M.

doi:10.1063/1.5038809

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In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X

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Langenberg, A.
Stellarator Heating and Optimisation (E3), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Kring, J., Pablant, N., Langenberg, A., Rice, J., Delgado-Aparicio, L., Maurer, D., et al. (2018). In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X. Review of Scientific Instruments, 89: 10F107. doi:10.1063/1.5038809.

Cite as: https://hdl.handle.net/21.11116/0000-0002-84AB-8

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