Reflection scanning near-field optical microscopy with uncoated fiber tips: How 
good is the resolution really?

Sandoghdar, Vahid; Wegscheider, S.; Krausch, G.; Mlynek, Jürgen

doi:10.1063/1.363957

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Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the resolution really?

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Sandoghdar, V., Wegscheider, S., Krausch, G., & Mlynek, J. (1997). Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the resolution really? Journal of Applied Physics, 81, 2499-2503. doi:10.1063/1.363957.

Cite as: https://hdl.handle.net/21.11116/0000-0002-9BE8-A

Abstract

We have investigated the optical resolution of a scanning near-field optical microscope in reflection collection mode using an uncoated fiber tip. We demonstrate that the apparent resolution in the optical signal (better than 70 nm) is a topography-induced effect. We believe that the purely optical resolution is only of the order of lambda/2 and diffraction limited. (C) 1997 American Institute of Physics.