English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Paper

Residual strain in free-standing CdTe nanowires overgrown with HgTe

MPS-Authors
There are no MPG-Authors available
Locator
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Kessel, M., Lunczer, L., Tarakina, N. V., Brüne, C., Buhmann, H., & Molenkamp, L. W. (2018). Residual strain in free-standing CdTe nanowires overgrown with HgTe. Retrieved from http://arxiv.org/abs/1812.01248.


Cite as: http://hdl.handle.net/21.11116/0000-0002-B017-D
Abstract
We investigate the crystal properties of CdTe nanowires overgrown with HgTe. Scanning electron microscopy (SEM) and scanning transmission electron microscopy (STEM) confirm, that the growth results in a high ensemble uniformity and that the individual heterostructures are single-crystalline, respectively. We use high-resolution X-ray diffraction (HRXRD) to investigate strain, caused by the small lattice mismatch between the two materials. We find that both CdTe and HgTe show changes in lattice constant compared to the respective bulk lattice constants. The measurements reveal a complex strain pattern with signatures of both uniaxial and shear strains present in the overgrown nanowires.