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Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy

MPS-Authors
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Macholdt,  Dorothea S.
Biogeochemistry, Max Planck Institute for Chemistry, Max Planck Society;
Climate Geochemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Förster,  Jan-David
Biogeochemistry, Max Planck Institute for Chemistry, Max Planck Society;
Multiphase Chemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Müller,  Maren
Dept. Butt: Physics at Interfaces, MPI for Polymer Research, Max Planck Society;

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Weber,  Bettina
Multiphase Chemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Kappl,  Michael
Dept. Butt: Physics at Interfaces, MPI for Polymer Research, Max Planck Society;

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Weigand,  Markus
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Leitner,  Jan
Particle Chemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Jochum,  Klaus Peter
Biogeochemistry, Max Planck Institute for Chemistry, Max Planck Society;
Climate Geochemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Pöhlker,  Christopher
Biogeochemistry, Max Planck Institute for Chemistry, Max Planck Society;
Multiphase Chemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Andreae,  Meinrat O.
Biogeochemistry, Max Planck Institute for Chemistry, Max Planck Society;
Multiphase Chemistry, Max Planck Institute for Chemistry, Max Planck Society;
Geology and Geophysics Department, King Saud University, Riyadh, Saudi Arabia;

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gi-8-97-2019.pdf
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Citation

Macholdt, D. S., Förster, J.-D., Müller, M., Weber, B., Kappl, M., Kilcoyne, A. L. D., et al. (2019). Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy. Geoscientific instrumentation, methods and data systems, 8(1), 97-111. doi:10.5194/gi-8-97-2019.


Cite as: https://hdl.handle.net/21.11116/0000-0003-3DC9-7
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