Artifacts from manganese reduction in rock samples prepared by focused ion beam 
(FIB) slicing for X-ray microspectroscopy

Macholdt, D. S.; Förster, J.-D.; Müller, M.; Weber, B.; Kappl, M.; Kilcoyne, A. L. D.; Weigand, M.; Leitner, J.; Jochum, K. P.; Pöhlker, C.; Andreae, M. O.

doi:10.5194/gi-8-97-2019

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Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy

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Weigand, M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Macholdt, D. S., Förster, J.-D., Müller, M., Weber, B., Kappl, M., Kilcoyne, A. L. D., et al. (2019). Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy. Geoscientific instrumentation, methods and data systems, 8(1), 97-111. doi:10.5194/gi-8-97-2019.

Cite as: https://hdl.handle.net/21.11116/0000-0003-571D-C

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