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Journal Article

An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography

MPS-Authors
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Peng,  Zirong
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kwiatkowski da Silva,  Alisson
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Ponge,  Dirk
Mechanism-based Alloy Design, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Peng, Z., Lu, Y., Hatzoglou, C., Kwiatkowski da Silva, A., Vurpillot, F., Ponge, D., et al. (2019). An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. Microscopy and Microanalysis, 25(2), 389-400. doi:10.1017/S1431927618016112.


Cite as: https://hdl.handle.net/21.11116/0000-0008-2B61-B
Abstract
We introduce an efficient, automated computational approach for analyzing interfaces within atom probe tomography datasets, enabling quantitative mapping of their thickness, composition, as well as the Gibbsian interfacial excess of each solute. Detailed evaluation of an experimental dataset indicates that compared with the composition map, the interfacial excess map is more robust and exhibits a relatively higher resolution to reveal compositional variations. By field evaporation simulations with a predefined emitter mimicking the experimental dataset, the impact of trajectory aberrations on the measurement of the thickness, composition, and interfacial excess of the decorated interface are systematically analyzed and discussed. © Microscopy Society of America 2019.