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XPS-Mapping of a Membrane Reactor Surface: Vanadium Oxidation State Variations

MPS-Authors

Suchorski,  Y.
Process Systems Engineering, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society;

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Rihko-Struckmann,  L.
Process Systems Engineering, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society;

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Ye,  Y.
Process Systems Engineering, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society;

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Sundmacher,  K.
Process Systems Engineering, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society;
Otto-von-Guericke-Universität Magdeburg, External Organizations;

Weiß,  H.
Process Systems Engineering, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society;

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Citation

Suchorski, Y., Rihko-Struckmann, L., Ye, Y., Sundmacher, K., & Weiß, H. (2005). XPS-Mapping of a Membrane Reactor Surface: Vanadium Oxidation State Variations. Poster presented at IWSP-2005, Polanica-Zdrój, Poland.


Cite as: http://hdl.handle.net/21.11116/0000-0003-8A7A-9
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