Elastic backscattering as a method for the measurement of the integral lithium 
content in thin films on fusion-relevant substrates

Krat, S.; Mayer, M.; Vasina, Ya.; Prishvitsyn, A.; Gasparyan, Yu.; Pisarev, A.

doi:10.1016/j.nimb.2019.06.025

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Elastic backscattering as a method for the measurement of the integral lithium content in thin films on fusion-relevant substrates

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Mayer, M.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Krat, S., Mayer, M., Vasina, Y., Prishvitsyn, A., Gasparyan, Y., & Pisarev, A. (2019). Elastic backscattering as a method for the measurement of the integral lithium content in thin films on fusion-relevant substrates. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 455, 124-133. doi:10.1016/j.nimb.2019.06.025.

Cite as: https://hdl.handle.net/21.11116/0000-0003-E95C-0

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