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New Applications to Atom Probe Tomography: Insights on Trace Element Diffusion in Naturally Deformed Minerals

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Department of Materials, Royal School of Mines, Imperial College London, London, UK;

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Schweinar,  Kevin
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Dubosq, R., Gault, B., Rogowitz, A., Schweinar, K., Zaefferer, S., & Schneider, D. (2019). New Applications to Atom Probe Tomography: Insights on Trace Element Diffusion in Naturally Deformed Minerals. Microscopy and Microanalysis, 25(S2), 2498-2499. doi:10.1017/S1431927619013229.


Cite as: http://hdl.handle.net/21.11116/0000-0004-A0FB-C
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