Improved serial sectioning workflow for multi-beam SEM applications – How to 
produce the ideal section for Volume EM

Tröger, Carola; Schulz, Kathrin; Irsen, Stephan

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Improved serial sectioning workflow for multi-beam SEM applications – How to produce the ideal section for Volume EM

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Tröger, Carola
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

Schulz, Kathrin
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

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Irsen, Stephan
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

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https://www.microscopy-conference.de/
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2019_Tröger_EMA_Poster_ImprovedSerialSectioning_05-2019.pdf
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Citation

Tröger, C., Schulz, K., & Irsen, S. (2019). Improved serial sectioning workflow for multi-beam SEM applications – How to produce the ideal section for Volume EM. Poster presented at Microscopy Conference MC 2019, organized by DGE Deutsche Gesellschaft für Elektronenmikroskopie e. V. (German Society for Electron Microscopy), Berlin.

Cite as: https://hdl.handle.net/21.11116/0000-0004-C3B9-F

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