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Conference Paper

Development of an XUV Frequency Comb for Precision Spectroscopy of Highly Charged Ions

MPS-Authors
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Oelmann,  Jan-Hendrik
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Nauta,  Janko
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Knauer,  Patrick
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Pappenberger,  Ronja
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Kühn,  Steffen
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Stark,  Julian
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Crespo López-Urrutia,  José Ramón
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Citation

Oelmann, J.-H., Nauta, J., Ackermann, A., Knauer, P., Pappenberger, R., Kühn, S., et al. (2019). Development of an XUV Frequency Comb for Precision Spectroscopy of Highly Charged Ions. In Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC). doi:10.1109/CLEOE-EQEC.2019.8872682.


Cite as: https://hdl.handle.net/21.11116/0000-0005-55EC-2
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