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Electronic structure based design of thin film metallic glasses with superior fracture toughness

MPS-Authors
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Kirchlechner,  Ines
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Soler,  Rafael
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kirchlechner,  Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kontis,  Paraskevas
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK;

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Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Supplementary Material (public)

1-s2.0-S0264127519307658-main.pdf
(Supplementary material), 2MB

Citation

Evertz, S., Kirchlechner, I., Soler, R., Kirchlechner, C., Kontis, P., Bednarcik, J., et al. (2020). Electronic structure based design of thin film metallic glasses with superior fracture toughness. Materials and Design, 186: 108327. doi:10.1016/j.matdes.2019.108327.


Cite as: http://hdl.handle.net/21.11116/0000-0005-5E93-C
Abstract
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