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3D Reconstruction of Identical Location Electron Micrographs – Methodology and Pitfalls

MPS-Authors
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Gänsler,  Thomas
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Hengge,  Katharina Anna
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Gänsler, T., Hengge, K. A., & Scheu, C. (2019). 3D Reconstruction of Identical Location Electron Micrographs – Methodology and Pitfalls. Poster presented at IAMNano 2019, International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, Düsseldorf, Germany.


Cite as: http://hdl.handle.net/21.11116/0000-0005-6F28-3
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